A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted... Show moreA method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an angle of incidence upon a crystal analyzer. A diffracted beam is emitted from the crystal analyzer onto a detector and digitized. A first image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a first angular position. A second image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a second angular position. A refraction image is obtained and a regularized mathematical inversion algorithm is applied to the refraction image to obtain a mass density image. Sponsorship: Illinois Institute of Technology United States Patent Show less
A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation... Show moreA method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within the transmitted beam. The intensity measurements of the transmitted beam are obtained by a crystal analyzer positioned at a plurality of angular positions. The plurality of intensity measurements are used to determine the angular intensity spectrum of the transmitted beam. One or more parameters, such as an attenuation property, a refraction property and a scatter property, can be obtained from the angular intensity spectrum and used to display an image of the object. Sponsorship: Illinois Institute of Technology United States Patent Show less
Query
(-) mods_name_creator_namePart_mt:"Wernick, Miles N."
