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  <titleInfo>
    <title>Diffraction Enhanced Imaging Method Using a Line X-Ray Source</title>
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  <name>
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    <namePart>Chapman, Leroy Dean</namePart>
  </name>
  <abstract>A method for detecting an enhanced image of an object by independently analyzing, detecting, digitizing, and combining images acquired on a high and a low angle side of a rocking curve of a crystal analyzer. An x-ray beam generated by a line x-ray source is collimated by a crystal monochromator including two non-matching crystals to form an x-ray area beam. The x-ray area beam is transmitted through an object to be imaged and onto an image detector and the image is digitized. The digitized images are simultaneously solved, preferably on a pixel-by-pixel basis, to derive an enhanced image which has dramatically improved contrast and spatial resolution over an image acquired through conventional radiology methods.</abstract>
  <note type="provenance">Submitted by Aric Ahrens (ahrens@iit.edu) on 2012-03-20T15:41:08Z No. of bitstreams: 1 7330530.pdf: 118301 bytes, checksum: 89d17131c7880cdd8b55d47dbf661f93 (MD5)</note>
  <note type="provenance">Made available in DSpace on 2012-03-20T15:41:08Z (GMT). No. of bitstreams: 1 7330530.pdf: 118301 bytes, checksum: 89d17131c7880cdd8b55d47dbf661f93 (MD5) Previous issue date: 2008-02-12</note>
  <note type="funding">Illinois Institute of Technology</note>
  <originInfo>
    <dateCaptured>2009-05-19</dateCaptured>
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  <originInfo>
    <dateCreated keyDate="yes">2008-02-12</dateCreated>
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  <identifier type="pn">7,330,530</identifier>
  <identifier type="hdl">http://hdl.handle.net/10560/2660</identifier>
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  <abstract>United States Patent</abstract>
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