Diffraction Enhanced Imaging Method Using a Line X-Ray Source Chapman, Leroy Dean A method for detecting an enhanced image of an object by independently analyzing, detecting, digitizing, and combining images acquired on a high and a low angle side of a rocking curve of a crystal analyzer. An x-ray beam generated by a line x-ray source is collimated by a crystal monochromator including two non-matching crystals to form an x-ray area beam. The x-ray area beam is transmitted through an object to be imaged and onto an image detector and the image is digitized. The digitized images are simultaneously solved, preferably on a pixel-by-pixel basis, to derive an enhanced image which has dramatically improved contrast and spatial resolution over an image acquired through conventional radiology methods. Sponsorship: Illinois Institute of Technology United States Patent 2009-05-19 2008-02-12 Patent application/pdf islandora:9824 7,330,530 http://hdl.handle.net/10560/2660 en No Copyright - United States http://rightsstatements.org/page/NoC-US/1.0/ Open Access