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    <title>Imaging Method Based on Attenuation, Refraction and Ultra-Small-Angle-Scattering of X-Rays</title>
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    <namePart>Wernick, Miles N.</namePart>
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  <name>
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    <namePart>Chapman, Leroy Dean</namePart>
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  <name>
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    <namePart>Oltulu, Oral</namePart>
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  <name>
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    <namePart>Zhong, Zhong</namePart>
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  <abstract>A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within the transmitted beam. The intensity measurements of the transmitted beam are obtained by a crystal analyzer positioned at a plurality of angular positions. The plurality of intensity measurements are used to determine the angular intensity spectrum of the transmitted beam. One or more parameters, such as an attenuation property, a refraction property and a scatter property, can be obtained from the angular intensity spectrum and used to display an image of the object.</abstract>
  <note type="provenance">Submitted by Aric Ahrens (ahrens@iit.edu) on 2012-01-24T17:19:52Z No. of bitstreams: 1 6947521.pdf: 144926 bytes, checksum: 9dc533063a398cb974e0ce1bff639d0d (MD5)</note>
  <note type="provenance">Made available in DSpace on 2012-01-24T17:19:52Z (GMT). No. of bitstreams: 1 6947521.pdf: 144926 bytes, checksum: 9dc533063a398cb974e0ce1bff639d0d (MD5) Previous issue date: 2005-09-20</note>
  <note type="funding">Illinois Institute of Technology</note>
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    <dateCaptured>2009-05-19</dateCaptured>
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  <originInfo>
    <dateCreated keyDate="yes">2005-09-20</dateCreated>
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  <identifier type="pn">6,947,521</identifier>
  <identifier type="hdl">http://hdl.handle.net/10560/2455</identifier>
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  <abstract>United States Patent</abstract>
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