
<oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:title>Imaging Method Based on Attenuation, Refraction and Ultra-Small-Angle-Scattering of X-Rays</dc:title>
  <dc:creator>Wernick, Miles N.</dc:creator>
  <dc:creator>Chapman, Leroy Dean</dc:creator>
  <dc:creator>Oltulu, Oral</dc:creator>
  <dc:creator>Zhong, Zhong</dc:creator>
  <dc:description>A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within the transmitted beam. The intensity measurements of the transmitted beam are obtained by a crystal analyzer positioned at a plurality of angular positions. The plurality of intensity measurements are used to determine the angular intensity spectrum of the transmitted beam. One or more parameters, such as an attenuation property, a refraction property and a scatter property, can be obtained from the angular intensity spectrum and used to display an image of the object.</dc:description>
  <dc:description>Sponsorship: Illinois Institute of Technology</dc:description>
  <dc:description>United States Patent</dc:description>
  <dc:date>2009-05-19</dc:date>
  <dc:date>2005-09-20</dc:date>
  <dc:type>Patent</dc:type>
  <dc:format>application/pdf</dc:format>
  <dc:identifier>islandora:9807</dc:identifier>
  <dc:identifier>6,947,521</dc:identifier>
  <dc:identifier>http://hdl.handle.net/10560/2455</dc:identifier>
  <dc:language>en</dc:language>
  <dc:rights>No Copyright - United States</dc:rights>
  <dc:rights>http://rightsstatements.org/page/NoC-US/1.0/</dc:rights>
  <dc:rights>Open Access</dc:rights>
</oai_dc:dc>