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  <titleInfo>
    <title>Bonding Pad-Oriented All-Mode ESD Protection Structure</title>
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  <name>
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    <namePart>Wang, Albert Zihui</namePart>
  </name>
  <abstract>An all-mode, bonding pad-oriented ESD (electrostatic discharge) protection structure, protects ICs against ESD pulses of all modes in all directions. A unique quasi-symmetrical layout design is devised to improve ESD structure. Physical symmetry and rounded layout provide uniform current and thermal distribution as well as symmetrical electrical operation characteristics. The ESD structure allows tunable triggering voltage, low holding voltage, low impedance, low leakage, fast response time and low parasitic effect. The ESD structure can easily be placed under or surrounding a bonding pad and consumes little extra silicon. The ESD structure can be implemented in commercial BiCMOS processes and is suitable for multiple-supply, mixed-signal, parasitic-sensitive RF and high-pin-count ICs.</abstract>
  <note type="provenance">Submitted by Aric Ahrens (ahrens@iit.edu) on 2012-01-12T19:37:35Z No. of bitstreams: 1 6635931.pdf: 234603 bytes, checksum: ada6414c53ca9b94e7b00646f539f30e (MD5)</note>
  <note type="provenance">Made available in DSpace on 2012-01-12T19:37:35Z (GMT). No. of bitstreams: 1 6635931.pdf: 234603 bytes, checksum: ada6414c53ca9b94e7b00646f539f30e (MD5) Previous issue date: 2003-10-21</note>
  <note type="funding">Illinois Institute of Technology</note>
  <originInfo>
    <dateCaptured>2009-05-14</dateCaptured>
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  <originInfo>
    <dateCreated keyDate="yes">2003-10-21</dateCreated>
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  <identifier type="pn">6,635,931</identifier>
  <identifier type="hdl">http://hdl.handle.net/10560/2445</identifier>
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  <abstract>United States Patent</abstract>
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