X-Ray Diffraction Method

$X-Ray Diffraction Method$

Download pdf

In collections

Details

Related Item: US Patent;2,511,152
Title: X-Ray Diffraction Method
Creator(s): Ekstein, Hans
Siegel, Stanley
Date: 1950-06-13
Description: United States Patent
Type: Patent
File type: application/pdf
Sponsor or funding information: Armour Research Foundation of Illinois Institute of Technology
Access: Open Access
Rights: No Copyright - United States
http://rightsstatements.org/page/NoC-US/1.0/
Identifier: http://hdl.handle.net/10560/76
Patent Number: 2,511,152